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Portugal – Scanning electron microscopes – Acquisition of 1 (one) dual Focused Ion Beam (FIB) microscopy system coupled to a Field Emission Scanning Electron Microscope (FEG-SEM) for the CICECO Associated Laboratory, Aveiro Institute of Materials - 425114

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This tender with title Portugal – Scanning electron microscopes – Acquisition of 1 (one) dual Focused Ion Beam (FIB) microscopy system coupled to a Field Emission Scanning Electron Microscope (FEG-SEM) for the CICECO Associated Laboratory, Aveiro Institute of Materials - 425114 has been published on Bidding Source portal dated 25 Jun 2026 for the country of Portugal. It has been categorized on Scanning electron microscopes. For similar tenders you can see tenders mentioned below of this page.

General Information

Portugal – Scanning electron microscopes – Acquisition of 1 (one) dual Focused Ion Beam (FIB) microscopy system coupled to a Field Emission Scanning Electron Microscope (FEG-SEM) for the CICECO Associated Laboratory, Aveiro Institute of Materials - 425114
Invitation for Bids
425114
Portugal
25 Jun 2026
28 Jun 2026
English
Scanning electron microscopes

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