Procurement Announcement for Double Aberration Corrected Electron Microscope, Transmission Electron Microscope and Cryo-Focused Ion Beam Cutting-Scanning Electron Microscope System - 8423747

This tender with title Procurement Announcement for Double Aberration Corrected Electron Microscope, Transmission Electron Microscope and Cryo-Focused Ion Beam Cutting-Scanning Electron Microscope System - 8423747 has been published on Bidding Source portal dated 21 Oct 2026 for the country of China . It has been categorized on Electron microscopes. For similar tenders you can see tenders mentioned below of this page.