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Procurement project of the joint system of low-temperature scanning probe microscope and in-situ transport measurement system from the School of Materials Science and Optoelectronic Technology, University of Chinese Academy of Sciences

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This tender with title Procurement project of the joint system of low-temperature scanning probe microscope and in-situ transport measurement system from the School of Materials Science and Optoelectronic Technology, University of Chinese Academy of Sciences -- 中国科学院大学材料科学与光电技术学院-低温扫描探针显微镜及原位输运测量联合系统采购项目 has been published on Bidding Source portal dated 22 Nov 2020 for the country of China . It has been categorized on Construction work for school buildings & Microscopes & Construction work for university buildings & Electronic equipment & Scanning probe microscopes. For similar tenders you can see tenders mentioned below of this page.

中国科学院大学材料科学与光电技术学院-低温扫描探针显微镜及原位输运测量联合系统采购项目

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China

Procurement project of the joint system of low-temperature scanning probe microscope and in-situ transport measurement system from the School of Materials Science and Optoelectronic Technology, University of Chinese Academy of Sciences
中国科学院大学材料科学与光电技术学院-低温扫描探针显微镜及原位输运测量联合系统采购项目
Invitation to Tender
China
北京市
22 Nov 2020
Chinese
Construction work for school buildings , Microscopes , Construction work for university buildings , Electronic equipment , Scanning probe microscopes

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