Προμήθεια συστήματος ηλεκτρονικής μικροσκοπίας μικροανάλυσης (SEM-EDS).

World Biggest Tenders Source

This tender with title Προμήθεια συστήματος ηλεκτρονικής μικροσκοπίας μικροανάλυσης (SEM-EDS). -- Scanning electron microscopes has been published on Bidding Source portal dated 08 Mar 2021 for the country of Greece. It has been categorized on Scanning electron microscopes. For similar tenders you can see tenders mentioned below of this page.

Scanning electron microscopes

General Information

Greece

Tender Title :

Προμήθεια συστήματος ηλεκτρονικής μικροσκοπίας μικροανάλυσης (SEM-EDS).
Scanning electron microscopes

Tender Type :

Invitation for Bids

Reference No. :

2021/S 044-109064

Country :

Greece

Province/City :

Greece-Acharnes

Publish Date :

8 Mar 2021

Closing Date :

5 Apr 2021

Notice Language :

English

Tender Categories (CPVs) :

Scanning electron microscopes

Full Tender Details :

For viewing full details of tenders, you should Log in to your account. If not registered yet, Please Register Now

Or Request a call back now and one of our representatives will contact you. Contact us

Similar Tenders

Awarded - Scanning electron microscopes – 38511100-1 - 480645 Greece 851795- Greece – Scanning electron microscopes – Announcement of an open tender above the thresholds for the supply of a scanning electron microscope and the provision of five-year warranty services (two-year free warranty services and three-year extended warranty services) Greece Awarded - Supply of a FIB/SEM microscope to the Superconductivity Laboratory of the NUC Department of the ENEA Frascati center - 629129 -- Contract Value: 1 279 003,50 EUR Italy Albstadt-Sigmaringen University of Applied Sciences scanning electron microscope with EDX system (FE-SEM) - 619492 Germany Awarded - Renewal of scanning electron microscope (FEI XL30) - 620117 -- Contract Value: 274 580,00 EUR Germany UPOL/PřF/KEF - FIB-SEM system including analytical techniques and nanoindentation - 606524 Czech Republic Awarded - Supply of a scanning electron microscope with EDXS analysis system including ancillary services (installation, maintenance, support) - 608780 Germany Scanning Electron Microscope, 1 Set - 6733140 Japan Awarded - Supply of a nuclearized double-beam electron and ion microscope (SEM-FIB) and its accessories (in-situ nano-indenter and metallization and carbon deposition system) for the Materials Physics Group. - 599044 -- Contract Value: 2 448 721,00 EUR France Albstadt-Sigmaringen University of Applied Sciences scanning electron microscope with EDX system (FE-SEM) - 550250 Germany

Προμήθεια συστήματος ηλεκτρονικής μικροσκοπίας μικροανάλυσης (SEM-EDS).

Scanning electron microscopes

General Information

Greece

Similar Tenders

Scanning electron microscopes Tenders

Greece Tenders

Europe Tenders

Tenders

info@biddingsource.com