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Thermal Field Emission Scanning Electron Microscope Platform for Automated Particle Analysis - NIST-MML-24-SS03

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This tender with title Thermal Field Emission Scanning Electron Microscope Platform for Automated Particle Analysis - NIST-MML-24-SS03 has been published on Bidding Source portal dated 21 Nov 2023 for the country of United States. It has been categorized on Electron microscopes & Laboratory, optical and precision equipments (excl. glasses) & Scanning electron microscopes. For similar tenders you can see tenders mentioned below of this page.

General Information

United States

Thermal Field Emission Scanning Electron Microscope Platform for Automated Particle Analysis - NIST-MML-24-SS03
Expression of Interest
United States
GAITHERSBURG
21 Nov 2023
7 Dec 2023
English
Electron microscopes , Laboratory, optical and precision equipments (excl. glasses) , Scanning electron microscopes

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