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Low-temperature semiconductor parameter comprehensive testing equipment procurement of Institute of Semiconductors, Chinese Academy of Sciences

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This tender with title Low-temperature semiconductor parameter comprehensive testing equipment procurement of Institute of Semiconductors, Chinese Academy of Sciences has been published on Bidding Source portal dated 14 Dec 2023 for the country of China . It has been categorized on Checking and testing apparatus & Miscellaneous evaluation or testing instruments & Semiconductors & Machines and apparatus for testing and measuring. For similar tenders you can see tenders mentioned below of this page.

General Information

Low-temperature semiconductor parameter comprehensive testing equipment procurement of Institute of Semiconductors, Chinese Academy of Sciences
Invitation to Tender
China
北京市
14 Dec 2023
Chinese
Checking and testing apparatus , Miscellaneous evaluation or testing instruments , Semiconductors , Machines and apparatus for testing and measuring

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