Scanning electron microscopes – RFP 240015 - ACQUISITION OF CRYOGENIC SCANNING ELECTRON MICROSCOPE SYSTEM (CRYO-SEM) AND ITS ASSOCIATED SERVICES OF COMMISSIONING, TRAINING AND MAINTENANCE - 313625-2024

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This tender with title Scanning electron microscopes – RFP 240015 - ACQUISITION OF CRYOGENIC SCANNING ELECTRON MICROSCOPE SYSTEM (CRYO-SEM) AND ITS ASSOCIATED SERVICES OF COMMISSIONING, TRAINING AND MAINTENANCE - 313625-2024 has been published on Bidding Source portal dated 31 May 2024 for the country of Luxembourg. It has been categorized on Scanning electron microscopes. For similar tenders you can see tenders mentioned below of this page.

General Information

Luxembourg

Tender Title :

Scanning electron microscopes – RFP 240015 - ACQUISITION OF CRYOGENIC SCANNING ELECTRON MICROSCOPE SYSTEM (CRYO-SEM) AND ITS ASSOCIATED SERVICES OF COMMISSIONING, TRAINING AND MAINTENANCE - 313625-2024

Tender Type :

Invitation for Bids

Country :

Luxembourg

Publish Date :

31 May 2024

Closing Date :

2 Jul 2024

Notice Language :

English

Tender Categories (CPVs) :

Scanning electron microscopes

Full Tender Details :

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Luxembourg – Scanning electron microscopes – RFP 240015 - ACQUISITION OF CRYOGENIC SCANNING ELECTRON MICROSCOPE SYSTEM (CRYO-SEM) AND ITS ASSOCIATED SERVICES OF COMMISSIONING, TRAINING AND MAINTENANCE Luxembourg Awarded - Supply of a FIB/SEM microscope to the Superconductivity Laboratory of the NUC Department of the ENEA Frascati center - 629129 -- Contract Value: 1 279 003,50 EUR Italy Albstadt-Sigmaringen University of Applied Sciences scanning electron microscope with EDX system (FE-SEM) - 619492 Germany Awarded - Renewal of scanning electron microscope (FEI XL30) - 620117 -- Contract Value: 274 580,00 EUR Germany UPOL/PřF/KEF - FIB-SEM system including analytical techniques and nanoindentation - 606524 Czech Republic Awarded - Supply of a scanning electron microscope with EDXS analysis system including ancillary services (installation, maintenance, support) - 608780 Germany Scanning Electron Microscope, 1 Set - 6733140 Japan Awarded - Supply of a nuclearized double-beam electron and ion microscope (SEM-FIB) and its accessories (in-situ nano-indenter and metallization and carbon deposition system) for the Materials Physics Group. - 599044 -- Contract Value: 2 448 721,00 EUR France Albstadt-Sigmaringen University of Applied Sciences scanning electron microscope with EDX system (FE-SEM) - 550250 Germany Awarded - Acquisition of 1 (one) dual Focused Ion Beam (FIB) microscopy system coupled to a Field Emission Scanning Electron Microscope (FEG-SEM) for the CICECO Associated Laboratory, Aveiro Institute of Materials - 544884 -- Contract Value: 600 000,00 EUR Portugal

Scanning electron microscopes – RFP 240015 - ACQUISITION OF CRYOGENIC SCANNING ELECTRON MICROSCOPE SYSTEM (CRYO-SEM) AND ITS ASSOCIATED SERVICES OF COMMISSIONING, TRAINING AND MAINTENANCE - 313625-2024

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Luxembourg

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