272733- Germany – Scanning electron microscopes – Precise ion beam based trenching tool (IMWS-03.2) + high performance Ga-FIB sample preparation (IMWS-08.1) + high performance analyical SEM inspection (IMWS-08.2) - PR924050-2690-P

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This tender with title 272733- Germany – Scanning electron microscopes – Precise ion beam based trenching tool (IMWS-03.2) + high performance Ga-FIB sample preparation (IMWS-08.1) + high performance analyical SEM inspection (IMWS-08.2) - PR924050-2690-P has been published on Bidding Source portal dated 29 Apr 2025 for the country of Germany. It has been categorized on Scanning electron microscopes. For similar tenders you can see tenders mentioned below of this page.

General Information

Germany

Tender Title :

272733- Germany – Scanning electron microscopes – Precise ion beam based trenching tool (IMWS-03.2) + high performance Ga-FIB sample preparation (IMWS-08.1) + high performance analyical SEM inspection (IMWS-08.2) - PR924050-2690-P

Tender Type :

Invitation for Bids

Reference No. :

272733

Country :

Germany

Publish Date :

29 Apr 2025

Notice Language :

English

Tender Categories (CPVs) :

Scanning electron microscopes

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272733- Germany – Scanning electron microscopes – Precise ion beam based trenching tool (IMWS-03.2) + high performance Ga-FIB sample preparation (IMWS-08.1) + high performance analyical SEM inspection (IMWS-08.2) - PR924050-2690-P

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