377443- Spain – Scanning electron microscopes – Supply and installation of a scanning electron microscope with FIB (Focused Ion Beam), X-ray analysis system and massive material ablation system using pulsed laser, intended for the Microelectronics Institute of Seville of the State Agency Higher Council for Scientific Research.

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This tender with title 377443- Spain – Scanning electron microscopes – Supply and installation of a scanning electron microscope with FIB (Focused Ion Beam), X-ray analysis system and massive material ablation system using pulsed laser, intended for the Microelectronics Institute of Seville of the State Agency Higher Council for Scientific Research. has been published on Bidding Source portal dated 12 Jun 2025 for the country of Spain. It has been categorized on Scanning electron microscopes. For similar tenders you can see tenders mentioned below of this page.

General Information

Spain

Tender Title :

377443- Spain – Scanning electron microscopes – Supply and installation of a scanning electron microscope with FIB (Focused Ion Beam), X-ray analysis system and massive material ablation system using pulsed laser, intended for the Microelectronics Institute of Seville of the State Agency Higher Council for Scientific Research.

Tender Type :

Invitation for Bids

Reference No. :

377443

Country :

Spain

Publish Date :

12 Jun 2025

Closing Date :

14 Jul 2025

Notice Language :

English

Tender Categories (CPVs) :

Scanning electron microscopes

Full Tender Details :

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