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377443- Spain – Scanning electron microscopes – Supply and installation of a scanning electron microscope with FIB (Focused Ion Beam), X-ray analysis system and massive material ablation system using pulsed laser, intended for the Microelectronics Institute of Seville of the State Agency Higher Council for Scientific Research.

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This tender with title 377443- Spain – Scanning electron microscopes – Supply and installation of a scanning electron microscope with FIB (Focused Ion Beam), X-ray analysis system and massive material ablation system using pulsed laser, intended for the Microelectronics Institute of Seville of the State Agency Higher Council for Scientific Research. has been published on Bidding Source portal dated 12 Jun 2025 for the country of Spain. It has been categorized on Scanning electron microscopes. For similar tenders you can see tenders mentioned below of this page.

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Spain

377443- Spain – Scanning electron microscopes – Supply and installation of a scanning electron microscope with FIB (Focused Ion Beam), X-ray analysis system and massive material ablation system using pulsed laser, intended for the Microelectronics Institute of Seville of the State Agency Higher Council for Scientific Research.
Invitation for Bids
377443
Spain
12 Jun 2025
14 Jul 2025
English
Scanning electron microscopes

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