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405820- Spain – Scanning electron microscopes – Supply and installation of a Dual Beam System for preparation of Lamellas (FIB) at the ICTS National Microscopy Center of the Complutense University of Madrid.

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This tender with title 405820- Spain – Scanning electron microscopes – Supply and installation of a Dual Beam System for preparation of Lamellas (FIB) at the ICTS National Microscopy Center of the Complutense University of Madrid. has been published on Bidding Source portal dated 01 Jul 2025 for the country of Spain. It has been categorized on Scanning electron microscopes. For similar tenders you can see tenders mentioned below of this page.

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Spain

405820- Spain – Scanning electron microscopes – Supply and installation of a Dual Beam System for preparation of Lamellas (FIB) at the ICTS National Microscopy Center of the Complutense University of Madrid.
Invitation for Bids
405820
Spain
1 Jul 2025
24 Jul 2025
English
Scanning electron microscopes

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