Supply and installation of a scanning electron microscope with FIB (Focused Ion Beam), X-ray analysis system, and pulsed laser mass ablation system for materials, for the Seville Microelectronics Institute of the State Agency Hig… - 6679185

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This tender with title Supply and installation of a scanning electron microscope with FIB (Focused Ion Beam), X-ray analysis system, and pulsed laser mass ablation system for materials, for the Seville Microelectronics Institute of the State Agency Hig… - 6679185 has been published on Bidding Source portal dated 10 Jul 2025 for the country of Spain. It has been categorized on Microscopes & Detection and analysis apparatus & X-ray devices & Medical equipments & Analysis apparatus & X-ray inspection equipment & Electron microscopes & Electronic equipment & Scanning electron microscopes & Microelectronic machinery and apparatus. For similar tenders you can see tenders mentioned below of this page.

General Information

Spain

Tender Title :

Supply and installation of a scanning electron microscope with FIB (Focused Ion Beam), X-ray analysis system, and pulsed laser mass ablation system for materials, for the Seville Microelectronics Institute of the State Agency Hig… - 6679185

Tender Type :

Invitation for Bids

Reference No. :

6679185

Country :

Spain

Publish Date :

10 Jul 2025

Notice Language :

Spanish

Tender Categories (CPVs) :

Microscopes , Detection and analysis apparatus , X-ray devices , Medical equipments , Analysis apparatus , X-ray inspection equipment , Electron microscopes , Electronic equipment , Scanning electron microscopes , Microelectronic machinery and apparatus

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Supply and installation of a scanning electron microscope with FIB (Focused Ion Beam), X-ray analysis system, and pulsed laser mass ablation system for materials, for the Seville Microelectronics Institute of the State Agency Hig… - 6679185

General Information

Spain

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