670373-Awarded - Spain – Scanning electron microscopes – Supply and installation of a scanning electron microscope with FIB (Focused Ion Beam), X-ray analysis system and massive material ablation system using pulsed laser, intended for the Microelectronics Institute of Seville of the State Agency Consejo Superior de Investigaciones Científicas.

This tender with title 670373-Awarded - Spain – Scanning electron microscopes – Supply and installation of a scanning electron microscope with FIB (Focused Ion Beam), X-ray analysis system and massive material ablation system using pulsed laser, intended for the Microelectronics Institute of Seville of the State Agency Consejo Superior de Investigaciones Científicas. -- Contract Value: 1 699 500,00 EUR has been published on Bidding Source portal dated 16 Oct 2025 for the country of Spain. It has been categorized on Scanning electron microscopes. For similar tenders you can see tenders mentioned below of this page.