Supply and installation of a scanning electron microscope with FIB (Focused Ion Beam), X-ray analysis system and pulsed laser mass ablation system for materials, intended for the Microelectronics Institute of Seville of the State … - 2303069

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This tender with title Supply and installation of a scanning electron microscope with FIB (Focused Ion Beam), X-ray analysis system and pulsed laser mass ablation system for materials, intended for the Microelectronics Institute of Seville of the State … - 2303069 has been published on Bidding Source portal dated 20 Oct 2025 for the country of Spain. It has been categorized on X-ray devices & Electronic equipment & Microelectronic machinery and apparatus & Microscopes & Analysis apparatus & Electron microscopes & Medical equipments & Scanning electron microscopes & Detection and analysis apparatus & X-ray inspection equipment. For similar tenders you can see tenders mentioned below of this page.

General Information

Spain

Tender Title :

Supply and installation of a scanning electron microscope with FIB (Focused Ion Beam), X-ray analysis system and pulsed laser mass ablation system for materials, intended for the Microelectronics Institute of Seville of the State … - 2303069

Tender Type :

Invitation for Bids

Reference No. :

2303069

Country :

Spain

Publish Date :

20 Oct 2025

Notice Language :

Spanish

Tender Categories (CPVs) :

X-ray devices , Electronic equipment , Microelectronic machinery and apparatus , Microscopes , Analysis apparatus , Electron microscopes , Medical equipments , Scanning electron microscopes , Detection and analysis apparatus , X-ray inspection equipment

Full Tender Details :

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Supply and installation of a scanning electron microscope with FIB (Focused Ion Beam), X-ray analysis system and pulsed laser mass ablation system for materials, intended for the Microelectronics Institute of Seville of the State … - 2303069

General Information

Spain

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