This tender with title 732881-Awarded - Czech Republic – Electron microscopes – Focused ion beam scanning electron microscope system for sample preparation for atom probe tomography -- Contract Value: 19 200 000,00 CZK has been published on Bidding Source portal dated 06 Nov 2025 for the country of Czech Republic. It has been categorized on Electron microscopes. For similar tenders you can see tenders mentioned below of this page.
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