loader

World Tenders & Procurement Opportunities

764807-Awarded - Netherlands – Scanning electron microscopes – Maintenance contract for the TEM (2 years) and PFIB (4 years)

World Biggest Tenders Source

This tender with title 764807-Awarded - Netherlands – Scanning electron microscopes – Maintenance contract for the TEM (2 years) and PFIB (4 years) has been published on Bidding Source portal dated 20 Nov 2025 for the country of Netherlands. It has been categorized on Scanning electron microscopes. For similar tenders you can see tenders mentioned below of this page.

General Information

764807-Awarded - Netherlands – Scanning electron microscopes – Maintenance contract for the TEM (2 years) and PFIB (4 years)
Contract Award
764807
Netherlands
20 Nov 2025
English
Scanning electron microscopes

For viewing full details of tenders, you should Log in to your account. If not registered yet, Please Register Now

Or Request a call back now and one of our representatives will contact you. Contact us

Similar Tenders

Laboratory, optical and precision equipments (excl. glasses) – Scanning Electron Microscope - 555720 Netherlands Scanning electron microscope to perform high resolution imaging and analysis during micro-mechanical testing -- Scanning electron microscope to perform high resolution imaging and analysis during micro-mechanical testing Netherlands Portugal – Scanning electron microscopes – Acquisition of 1 (one) dual Focused Ion Beam (FIB) microscopy system coupled to a Field Emission Scanning Electron Microscope (FEG-SEM) for the CICECO Associated Laboratory, Aveiro Institute of Materials - 425114 Portugal Tabletop Scanning Electron Microscope (SEM) with EDS - FA700026Q0064 United States Germany – Scanning electron microscopes – Erneuerung Rasterelektronenmikroskop (FEI XL30) - 415839 Germany Germany – Scanning electron microscopes – Lieferung eines Rasterelektronenmikroskop mit EDXS-Analysesystem einschließlich Nebenleistungen (Installation, Wartung, Support) - 416632 Germany Switzerland – Scanning electron microscopes – MEBMHN_A1 / Acquisition d'un microscope électronique à balayage - 421041 Switzerland Field Emission Scanning Electron Microscope System 1 set - 8543746 Japan Preventive Maintenance and Repair Service Agreement for two Zeiss Merlin Field Emission Gun Scanning Electron Microscope (FEG SEM) and a Gatan 3View serial block face sectioning device - 72159124 -- J066 - MAINT/REPAIR/REBUILD OF EQUIPMENT- INSTRUMENTS AND LABORATORY EQUIPMENT United States Low-energy high-speed scanning electron microscope - 5216935 China
No. 12, 1 st floor, Block B2, EGS Business Park, World Trade Center, Bakirkoy - Istanbul - Turkey
info@biddingsource.com
24 X 7 online support
TOP
For viewing latest tenders published for your business in all over the World: Sign in Join free
For accessing full details of Tenders, Kindly choose the Plan that works for you: View Subscription Plans