Maintenance and repair service procurement project for the Focused Ion Beam-Electron Beam Dual-Beam Microscope (FIB) at the Dalian Institute of Chemical Physics, Chinese Academy of Sciences - 3006170

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This tender with title Maintenance and repair service procurement project for the Focused Ion Beam-Electron Beam Dual-Beam Microscope (FIB) at the Dalian Institute of Chemical Physics, Chinese Academy of Sciences - 3006170 has been published on Bidding Source portal dated 08 Dec 2025 for the country of China . It has been categorized on Medical equipments & Microscopes & Repair and maintenance services of medical and surgical equipment. For similar tenders you can see tenders mentioned below of this page.

General Information

China

Tender Title :

Maintenance and repair service procurement project for the Focused Ion Beam-Electron Beam Dual-Beam Microscope (FIB) at the Dalian Institute of Chemical Physics, Chinese Academy of Sciences - 3006170

Tender Type :

Invitation to Tender

Reference No. :

3006170

Country :

China

Province/City :

大连市

Publish Date :

8 Dec 2025

Notice Language :

Chinese

Tender Categories (CPVs) :

Medical equipments , Microscopes , Repair and maintenance services of medical and surgical equipment

Full Tender Details :

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Maintenance and repair service procurement project for the Focused Ion Beam-Electron Beam Dual-Beam Microscope (FIB) at the Dalian Institute of Chemical Physics, Chinese Academy of Sciences - 3006170

General Information

China

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