Tender focused ion beam scanning electron-9955448

This tender with title Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Instrument - 1333ND26QNB030053 -- 6640 - LABORATORY EQUIPMENT AND SUPPLIES has been published on Bidding Source portal dated 11 Feb 2026 for the country of United States. It has been categorized on Electron microscopes & Scanning electron microscopes. For similar tenders you can see tenders mentioned below of this page.

6640 - LABORATORY EQUIPMENT AND SUPPLIES

General Information

United States

Tender Title :

Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Instrument - 1333ND26QNB030053
6640 - LABORATORY EQUIPMENT AND SUPPLIES

Tender Type :

Invitation for Bids

Reference No. :

1333ND26QNB030053

Country :

United States

Publish Date :

11 Feb 2026

Closing Date :

5 Mar 2026

Notice Language :

English

Tender Categories (CPVs) :

Electron microscopes , Scanning electron microscopes

Full Tender Details :

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Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Instrument - 1333ND26QNB030053

6640 - LABORATORY EQUIPMENT AND SUPPLIES

General Information

United States

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