Darkfield and scanning probe microscopes tenders , Page 13

List of Tenders

Total: 209

Adquisición, instalación y puesta en funcionamiento de un microscopio de sonda de barrido SPM que trabaje en los modos contacto y tapping y que permita medidas de AFM electroquímico y de microscopia de barrido electroquímica (ECSM) -- Scanning probe microscopes

Publish Date: 2 Aug 2021

Closing Date: 6 Sep 2021

Country: Spain

Tender Type: Invitation for Bids

Language: English

Dostawa mikroskopu sił atomowych, nr sprawy WF-37-15/21 -- Scanning probe microscopes

Publish Date: 27 Jul 2021

Closing Date: 26 Aug 2021

Country: Poland

Tender Type: Invitation for Bids

Language: English

AFM-IR-Mikroskop

Publish Date: 8 Jul 2021

Closing Date: 3 Aug 2021

Country: Germany

Tender Type: Invitation for Bids

Language: English

Scanning probe microscope 1 Set

Publish Date: 29 Jun 2021

Closing Date:

Country: Japan

Tender Type: Invitation to Tender

Language: English

Lieferung und Installation eines Rasterkraftmikroskops (AFM)

Publish Date: 28 Jun 2021

Closing Date: 23 Jul 2021

Country: Germany

Tender Type: Invitation for Bids

Language: English

Tieftemperatur-Rastertunnelmikroskop und Rasterkraftmikroskop -- Scanning probe microscopes

Publish Date: 14 Jun 2021

Closing Date: 9 Jul 2021

Country: Germany

Tender Type: Invitation for Bids

Language: English

Tieftemperatur-Rastertunnelmikroskop und Rasterkraftmikroskop -- Scanning probe microscopes

Publish Date: 10 Jun 2021

Closing Date: 9 Jul 2021

Country: Germany

Tender Type: Invitation for Bids

Language: English

Fourniture, livraison et installation d’un microscope à effet tunnel sous vide et basse température -- Darkfield and scanning probe microscopes

Publish Date: 4 May 2021

Closing Date: 31 May 2021

Country: France

Tender Type: Invitation for Bids

Language: English

Microscop cu sondă de scanare -- Scanning probe microscope supply

Publish Date: 27 Apr 2021

Closing Date: 19 May 2021

Country: Moldova

Tender Type: Invitation to Tender

Language: Romanian

High-speed wide-area scanning probe microscope 1 set

Publish Date: 14 Apr 2021

Closing Date:

Country: Japan

Tender Type: Invitation to Tender

Language: English

Darkfield and scanning probe microscopes tenders

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