Доставка на специализиран AFM сканиращ микроскоп за мултифизични изследвания за нуждите на Технически университет — София, ......продължение в раздел VI.3 „Допълнителна информация“

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This tender with title Доставка на специализиран AFM сканиращ микроскоп за мултифизични изследвания за нуждите на Технически университет — София, ......продължение в раздел VI.3 „Допълнителна информация“ -- Scanning electron microscopes has been published on Bidding Source portal dated for the country of Bulgaria. It has been categorized on Scanning electron microscopes. For similar tenders you can see tenders mentioned below of this page.

Scanning electron microscopes

General Information

Bulgaria

Tender Title :

Доставка на специализиран AFM сканиращ микроскоп за мултифизични изследвания за нуждите на Технически университет — София, ......продължение в раздел VI.3 „Допълнителна информация“
Scanning electron microscopes

Tender Type :

Invitation for Bids

Reference No. :

2021/S 112-291891

Country :

Bulgaria

Province/City :

Bulgaria-Sofia

Closing Date :

15 Jul 2021

Notice Language :

English

Tender Categories (CPVs) :

Scanning electron microscopes

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419794- Bulgaria – Scanning electron microscopes – Delivery of a professional scanning electron microscope for the needs of the University of Ruse "Angel Kanchev" under contract BG-RRP-2.013-0001 Bulgaria Доставка на специализиран AFM сканиращ микроскоп за мултифизични изследвания за нуждите на Технически университет — София, ......продължение в раздел VI.3 „Допълнителна информация“ -- Scanning electron microscopes Bulgaria Доставка, инсталиране и поддръжка на специализирано изследователско оборудване — сканиращ електронен микроскоп, за нуждите на Централна лаборатория по приложна физика — БАН, гр. Пловдив Bulgaria Supply of Focused Ion Beam & Scanning Electron Microscope system (FIB-SEM) 1 Set - 792740 Japan Scanning Electron Microscope with EDS - PR-002205 -- 6640 - LABORATORY EQUIPMENT AND SUPPLIES United States Scanning electron microscope at Harbin Institute of Technology - 9472389 China Benchtop Scanning Electron Microscope (SEM) - 5-B175-Q-00601-00 -- 5860 - STIMULATED COHERENT RADIATION DEVICES, COMPONENTS, AND ACCESSORIES United States 405820- Spain – Scanning electron microscopes – Supply and installation of a Dual Beam System for preparation of Lamellas (FIB) at the ICTS National Microscopy Center of the Complutense University of Madrid. Spain 382154- Italy – Scanning electron microscopes – Open procedure for the supply and installation of a Scanning Electron Microscope (SEM) Italy 377443- Spain – Scanning electron microscopes – Supply and installation of a scanning electron microscope with FIB (Focused Ion Beam), X-ray analysis system and massive material ablation system using pulsed laser, intended for the Microelectronics Institute of Seville of the State Agency Higher Council for Scientific Research. Spain

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Scanning electron microscopes

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Bulgaria

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