China - Focused ion beam scanning electron microscope (imported)

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This tender with title China - Focused ion beam scanning electron microscope (imported) has been published on Bidding Source portal dated 13 Sep 2023 for the country of China . It has been categorized on Scanning electron microscopes & Electron microscopes. For similar tenders you can see tenders mentioned below of this page.

General Information

China

Tender Title :

China - Focused ion beam scanning electron microscope (imported)

Tender Type :

Invitation to Tender

Country :

China

Province/City :

沈阳市

Publish Date :

13 Sep 2023

Closing Date :

19 Sep 2023

Notice Language :

Chinese

Tender Categories (CPVs) :

Scanning electron microscopes , Electron microscopes

Full Tender Details :

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China - Focused ion beam scanning electron microscope (imported)

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China

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