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Scanning Electron Microscope (SEM) Analytical Detectors including Direct Electron EBSD - NIST-SS24-CHIPS-0002

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This tender with title Scanning Electron Microscope (SEM) Analytical Detectors including Direct Electron EBSD - NIST-SS24-CHIPS-0002 has been published on Bidding Source portal dated 15 Jan 2024 for the country of United States. It has been categorized on Electron microscopes & Scanning electron microscopes. For similar tenders you can see tenders mentioned below of this page.

General Information

United States

Scanning Electron Microscope (SEM) Analytical Detectors including Direct Electron EBSD - NIST-SS24-CHIPS-0002
Expression of Interest
United States
GAITHERSBURG
15 Jan 2024
25 Jan 2024
English
Electron microscopes , Scanning electron microscopes

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