Analytical scanning electron microscope with focused ion beam - 2nd announcement - 521811

World Biggest Tenders Source

This tender with title Analytical scanning electron microscope with focused ion beam - 2nd announcement - 521811 has been published on Bidding Source portal dated 03 Sep 2024 for the country of Czech Republic. It has been categorized on Electron microscopes & Scanning electron microscopes. For similar tenders you can see tenders mentioned below of this page.

General Information

Czech Republic

Tender Title :

Analytical scanning electron microscope with focused ion beam - 2nd announcement - 521811

Tender Type :

Invitation for Bids

Country :

Czech Republic

Publish Date :

3 Sep 2024

Closing Date :

30 Sep 2024

Notice Language :

English

Tender Categories (CPVs) :

Electron microscopes , Scanning electron microscopes

Full Tender Details :

For viewing full details of tenders, you should Log in to your account. If not registered yet, Please Register Now

Or Request a call back now and one of our representatives will contact you. Contact us

Similar Tenders

674537-Awarded - Czech Republic – Scanning electron microscopes – Scanning electron microscope with EDS analytical system Czech Republic 629505-Awarded - Czech Republic – Electron microscopes – Transmission electron microscope -- Contract Value: 15 521 233,00 CZK Czech Republic 625082-Awarded - Czech Republic – Electron microscopes – Scanning electron microscope probes -- Contract Value: 8 114 100,00 CZK Czech Republic 582768- Czech Republic – Scanning electron microscopes – Scanning electron microscope with EDS analytical system Czech Republic 583111-Awarded - Czech Republic – Electron microscopes – ERDFIII_Tabletop TEM/SEM -- Contract Value: 5 964 300,00 CZK Czech Republic 567529-Awarded - Czech Republic – Scanning electron microscopes – Delivery of an electron microscope (0442000015) -- Contract Value: 5 118 000,00 CZK Czech Republic 417323- Czech Republic – Electron microscopes – Scanning electron microscope probes Czech Republic 284663- Czech Republic – Electron microscopes – Focused ion beam scanning electron microscope system for sample preparation for atom probe tomography Czech Republic 218173-Awarded - Czech Republic – Electron microscopes – Vysokorozlišovací skenovací elektronový mikroskop s analýzou prvkového a fázového složení a krystalografické orientace -- Contract Value: 16 400 000,00 CZK Czech Republic High-resolution transmission electron microscope (HRTEM/STEM) with electron and X-ray spectroscopy (EELS, EDX) - 70861 Czech Republic

Analytical scanning electron microscope with focused ion beam - 2nd announcement - 521811

General Information

Czech Republic

Similar Tenders

Electron microscopes Tenders

Scanning electron microscopes Tenders

Czech Republic Tenders

Europe Tenders

Tenders

info@biddingsource.com