Tender usafa scanning electron microscope --8752258

This tender with title USAFA Scanning Electron Microscope - FA700025Q0058 -- 6640 - LABORATORY EQUIPMENT AND SUPPLIES has been published on Bidding Source portal dated 10 Jun 2025 for the country of United States. It has been categorized on Electron microscopes & Scanning electron microscopes. For similar tenders you can see tenders mentioned below of this page.

6640 - LABORATORY EQUIPMENT AND SUPPLIES

General Information

United States

Tender Title :

USAFA Scanning Electron Microscope - FA700025Q0058
6640 - LABORATORY EQUIPMENT AND SUPPLIES

Tender Type :

Invitation for Bids

Reference No. :

FA700025Q0058

Country :

United States

Publish Date :

10 Jun 2025

Closing Date :

21 Jul 2025

Notice Language :

English

Tender Categories (CPVs) :

Electron microscopes , Scanning electron microscopes

Full Tender Details :

For viewing full details of tenders, you should Log in to your account. If not registered yet, Please Register Now

Or Request a call back now and one of our representatives will contact you. Contact us

Similar Tenders

SOLE SOURCE – JEOL Scanning Electron Microscope (SEM) - N0016425Q0738 -- 6640 - LABORATORY EQUIPMENT AND SUPPLIES United States Equipment and Training for JEOL IT-800 scanning electron microscope - RFQ389263 -- 6640 - LABORATORY EQUIPMENT AND SUPPLIES United States Scanning Electron Microscope with EDS - PR-002205 -- 6640 - LABORATORY EQUIPMENT AND SUPPLIES United States Benchtop Scanning Electron Microscope (SEM) - 5-B175-Q-00601-00 -- 5860 - STIMULATED COHERENT RADIATION DEVICES, COMPONENTS, AND ACCESSORIES United States TESCAN SCANNING ELECTRON MICROSCOPE (SEM) PREVENTATIVE MAINTENANCE AND REPAIR - FA860125Q0117 -- J066 - MAINT/REPAIR/REBUILD OF EQUIPMENT- INSTRUMENTS AND LABORATORY EQUIPMENT United States Annual Maintenance of FEI Helios 600i Focused Ion Beam / Scanning Electron Microscope for Benet Laboratories, Watervliet, NY - W911PT25Q0053 -- J036 - MAINT/REPAIR/REBUILD OF EQUIPMENT- SPECIAL INDUSTRY MACHINERY United States Scanning Electron Microscope (SEM) Maintenance Agreement - W913T25Q0002 -- 6650 - OPTICAL INSTRUMENTS, TEST EQUIPMENT, COMPONENTS AND ACCESSORIES United States CHIPS R&D: Service Agreement for a Hitachi S5500 Scanning Electron Microscope (SEM) - NIST-SS25-CHIPS-0014 -- J066 - MAINT/REPAIR/REBUILD OF EQUIPMENT- INSTRUMENTS AND LABORATORY EQUIPMENT United States Field-Emission Scanning Electron Microscope (FE-SEM) - 4-B175-Q-00761-00 -- 6640 - LABORATORY EQUIPMENT AND SUPPLIES United States Scanning electron microscope maintenance - ScanningelectronmicroscopemaintenanceRFI -- J036 - MAINT/REPAIR/REBUILD OF EQUIPMENT- SPECIAL INDUSTRY MACHINERY United States

USAFA Scanning Electron Microscope - FA700025Q0058

6640 - LABORATORY EQUIPMENT AND SUPPLIES

General Information

United States

Similar Tenders

Electron microscopes Tenders

Scanning electron microscopes Tenders

United States Tenders

North America Tenders

Tenders

info@biddingsource.com